Reliability Studies
SiC ZERO RECOVERY® Schottky Diode Reliability at Extremely High Voltage Slew Rates, 2001-2005 Cree, Inc.
The Influence of 200° C Junction Temperature Transients on ZERO RECOVERY® Schottky Diode Power Cycle Reliability, 2001-2005 Cree, Inc.
SiC Power Diode Reliability - October 2008
